Cultural Heritage
FE-SEM with EDS for Microanalysis
The FE-SEM electron microscope is equipped with a field emission source, four different detectors (BSE, SE2, InLens, STEM) and an X-ray emission detection sensor (EDS) for localised compositional analysis.
Its excellent imaging properties, combined with its analytical capabilities, make this instrument versatile and suited to a wide range of applications, such as materials development, defect analysis, process control, nanotechnology and analytical applications.
This instrumentation is particularly suited for:
- Study and characterisation of ceramic, glass, metallic and composite materials.
- Defect studies
- Morphological and analytical study of particulates and micro- and nano-dispersed materials.
- Qualitative determination of asbestos in bulk samples and airborne fibre concentration
OPTICAL MICROSCOPY
Instrumentation suited for:
Cultural heritage: study of samples to identify paint layers, pigments and other details relating to artworks and historical artefacts.
Materials analysis: study of microstructures, including grain size, inclusions and defects in metals, ceramics, glass and other materials.
Deposit evaluation: analysis of the thickness and morphology of surface deposits.
Defect and corrosion identification: detection of corrosive attack and other material defects.
UV-Vis Spectrophotometer
A technique based on measuring the absorption of ultraviolet and visible radiation by a sample, useful for qualitative and quantitative analysis of chemical species in solution or dispersion.
- Applications:
- Quantitative determination of chemical species in solution
- Study of the optical properties of nanoparticles and dispersed materials
- Monitoring of chemical reactions and degradation processes
XRF
X-ray fluorescence spectroscopy (XRF) is a technique used for the elemental analysis of solids or liquids with minimal sample preparation. The sample is irradiated with an X-ray beam, exciting its atoms, which then emit X-rays as they relax. The wavelengths of the emitted X-rays are characteristic of the atomic species present.
Its applications are broad, including analysis of building materials, cultural heritage conservation (identifying pigments and alloys), geology (studying rocks and minerals), environmental monitoring, and quality control across various industrial sectors (e.g. ceramics, glass, metals, oil).
Instrumentation suited for:
- Qualitative identification of chemical elements (from F to U) present in the sample, at percentage fractions up to 100%.
- Quantitative determination of chemical elements (from F to U) present in the sample.
XRD, HT-XRD and Low-Angle Analysis
X-ray diffraction (XRD) is a non-destructive technique for the qualitative and quantitative analysis of crystalline materials, used to identify crystal structure, identify and quantify crystalline phases present, and analyse defects and crystallite size.
It is widely used in industry, geology and mineralogy, as well as in the study of advanced materials, coatings, pharmaceuticals and restoration products.
Instrumentation suited for:
- determining which crystalline compounds are present in a powder or solid sample, and in what percentage.
- with a grazing-incidence accessory: it is possible to characterise thin films and coatings with thicknesses on the order of nanometres.
- with a high-temperature chamber accessory (HT-XRD): it is possible to study the thermal stability and phase transformations of materials (e.g. ceramics, metals, catalysts) at high operating temperatures, to optimise their efficiency and durability.